Facilities

Instruments

Aberration-corrected scanning transmission electron microscopes designed for atom-by-atom imaging, chemical mapping, and electron spectroscopy of energy materials.

jeol-arm300f-1

jeol-arm300f-2

jeol-arm300f-3

JEOL JEM-ARM300F

300-kV Grand ARM Transmission Electron Microscope

The JEOL JEM-ARM300F transmission electron microscope exceeds the atomic-resolution boundaries available in commercial TEMs. With 63 pm resolution at 300 kV and full aberration correction, it is designed for atom-by-atom imaging and chemical mapping of advanced materials.

300 kV accelerating voltage
63 pm STEM resolution
Aberration-corrected probe
Atom-by-atom characterization and chemical mapping

jeol-arm200f-1

jeol-arm200f-2

jeol-arm200f-3

JEOL JEM-ARM200F

200-kV Atomic Resolution Analytical TEM

A high-performance 200 kV TEM featuring a Schottky field-emission cathode, Cs correctors for spherical-aberration correction, and a motorized five-axis goniometer. It delivers STEM resolution better than 0.08 nm and TEM resolution of 0.11 nm, with EDS, EELS, and optional electron tomography via TEMography software.

200 kV Schottky field-emission cathode
Cs correctors (spherical-aberration corrected)
STEM 0.08 nm / TEM 0.11 nm resolution
EDS · EELS · electron tomography (TEMography)
Motorized five-axis goniometer